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KSH13009L
KSH13009L
SEMIHOW REV.A0,May 2003
KSH13009L
KSH13009L
Switch Mode series NPN silicon Power Transistor
- High voltage, high speed power switching - Suitable for switching regulator, inverters motor controls
12 Amperes NPN Silicon Power Transistor 100 Watts
Absolute Maximum Ratings
CHARACTERISTICS Collector-Base Voltage Collector-Emitter Voltage Emitter-Base Voltage Collector Current(DC) Collector Current(Pulse) Base Current Collector Dissipation(Tc=25) Junction Temperature Storage Temperature
TC=25 unless otherwise noted SYMBOL VCBO VCEO VEBO IC ICP IB PC TJ TSTG RATING 700 400 9 12 24 6 130 150 -65~150 UNIT V V V A A A W
TO-3P 1. Base 2. Collector 3. Emitter
12 3
Electrical Characteristics
CHARACTERISTICS Collector-Emitter Sustaining Voltage Emitter Cut-off Current *DC Current Gain *Collector-Emitter Saturation Voltage
TC=25 unless otherwise noted SYMBOL VCEO(sus) IEBO hFE1 hFE2 VCE(sat) Test Condition IC=10mA, IB=0 VEB=9V,IC=0 VCE=5V,IC=5A VCE=5V,IC=8A IC=5A,IB=1A IC=8A,IB=1.6A IC=12A,IB=3A IC=5A,IB=1A IC=8A,IB=1.6A VCB=10V, f=0.1MHz VCE=10V,IC=0.5A Vcc=125V, Ic=8A IB1=1.6A, IB2= -1.6A RL=15.6 4 1.1 3 0.7 180 8 6 Min 400 1 40 30 1 1.5 3 1.2 1.6 V V V V V pF MHz S S S Typ. Max Unit V mA
*Base-Emitter Saturation Voltage Output Capacitance Current Gain Bandwidth Product Turn on Time Storage Time Fall Time
* Pulse Test: Pulse Width300s, Duty Cycle2%
VBE(sat) Cob fT ton tstg tF
Note :
hFE1 Classification
R :8 ~ 17,
O : 15 ~ 28,
Y : 26 ~ 39
SEMIHOW REV.A0,May 2003
KSH13009L
Typical Characteristics
SEMIHOW REV.A0,May 2003
KSH13009L
Typical Characteristics ( Continued )
SEMIHOW REV.A0,May 2003
KSH13009L
Package Dimensions
Dimensions in Millimeters
SEMIHOW REV.A0,May 2003
KSH13009L
Reliability Qualification
A. High Temperature Reverse Bias ( HTRB )
The purpose of this test is to determine the sensitivity of the product to mobile ion contamination and related failure mechanisms.
Conditions: JESD22-A108, JIS C 7021 B-8 TA=150 VCB=80% max rated VCB
Sample Size 45 #of Fail 0 Cum. Fail% 0.0% 168hrs 0 300hrs 0
B. Pressure Cooker Test ( PCT ) Autoclave ( ACLV )
The purpose of this test is to evaluate the moisture resistance of non-hermetic components under pressure/temperature conditions.
Conditions: JESD22-A102, JIS C 7021 A-6 TA=121 RH=100% P=1 atmosphere (15psig)
Sample Size 45 #of Fail 0 Cum. Fail% 0.0% 48hrs 0
C. Temperature Humidity Bias ( THBT )
The purpose of this test is to evaluate the moisture resistance of non-hermetic components. The addition of voltage bias accelerates the corrosive effect after moisture penetration has taken place. with time, this is a catastrophically destructive test.
Conditions: JESD22-A101 TA=85 RH=85% VCB=80% max rated VCB
Sample Size 45 #of Fail 0 Cum. Fail% 0.0% 168hrs 0 300hrs 0
SEMIHOW REV.A0,May 2003
KSH13009L
Reliability Qualification ( Continued )
D. High Temperature Storage Life ( HTSL )
The purpose of this test is to expose time/temperature failure mechanisms and to evaluate long-term strong stability.
Conditions: JESD22-A103, JIS C 7021 B-10 TA=Tstg(max)
Sample Size 45 #of Fail 0 Cum. Fail% 0.0% 168hrs 0 300hrs 0
E. Temperature Cycle Air-to Air ( TMCL )
The purpose of this test is to evaluate the ability of the device to withstand both exposure to extreme temperature and the transition between temperature extreme, and to exposure excessive thermal mismatch between materials.
Conditions: JESD22-A104, JIS C 7021 A-4 Air to air, -65~150, 15 minutes dwell time at each temperature
Sample Size 45 #of Fail 0 Cum. Fail% 0.0% 100cycles 0 200cycles 0
SEMIHOW REV.A0,May 2003

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